Applied Reliability, Third Edition

Voorkant
CRC Press, 1 jan 1995 - 424 pagina's
With over 170 pages of new material, the second edition of this widely used reference provides engineers and statisticians with an updated, easy-to-follow approach to evaluating and projecting component and system reliability by combining standard statistical methods with advanced leading-edge reliability techniques. It includes an extensive treatment of life distribution and accelerated testing models and data analysis and data simulation techniques, as well as quality control methods and algorithms used to predict component and assembly field reliability.

The second edition includes three completely new chapters: two cover "Repairable System Reliability" (both for renewal and non-renewal models), with an emphasis on simple graphical techniques, while also describing analytical methods for reparable system data analysis. A third new chapter surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs.

In addition, this latest edition offers hundreds of new examples, exercises, problems, and references-all designed to provide readers with additional support in understanding and applying the latest reliability testing methods.

In bringing state-of-the-art techniques down to an accessible, how-to level, the second edition of Applied Reliability will serve the practical needs of electronic, mechanical, and industrial engineers involved in the design and manufacture of components and systems, and of statisticians and scientists working on applied reliability problems. It will also be a highly suitable textbook for engineering courses in applied reliability and quality control.
 

Inhoudsopgave

THE WEIBULL DISTRIBUTION81
81
Extreme Value Distribution Relationship89
89
Simulating Weibull Random Variables101
101
Applications of the Normal Distribution112
112
The Lognormal Life Distribution120
120
Lognormal Parameter Estimation127
127
RELIABILITY DATA PLOTTING135
135
Probability Plotting for the Exponential Distribution142
142
SYSTEM MODELS AND RELIABILITY ALGORITHMS219
219
APPLICATIONS
251
Confidence Intervals for Low PPM264
264
Generating a Sampling Plan277
277
Minimum Sample Size Plans290
290
RENEWAL PROCESSES303
303
NONRENEWAL
334
Testing for Trends and Randomness340
340

Probability Plotting for the Weibull Distribution151
151
Multicensored Data160
160
PHYSICAL ACCELERATION MODELS166
166
Nonhomogeneous Poisson Processes354
354
Simulation of Stochastic Processes367
367
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