Applied Reliability, Third EditionCRC Press, 1 jan 1995 - 424 pagina's With over 170 pages of new material, the second edition of this widely used reference provides engineers and statisticians with an updated, easy-to-follow approach to evaluating and projecting component and system reliability by combining standard statistical methods with advanced leading-edge reliability techniques. It includes an extensive treatment of life distribution and accelerated testing models and data analysis and data simulation techniques, as well as quality control methods and algorithms used to predict component and assembly field reliability. The second edition includes three completely new chapters: two cover "Repairable System Reliability" (both for renewal and non-renewal models), with an emphasis on simple graphical techniques, while also describing analytical methods for reparable system data analysis. A third new chapter surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs. In addition, this latest edition offers hundreds of new examples, exercises, problems, and references-all designed to provide readers with additional support in understanding and applying the latest reliability testing methods. In bringing state-of-the-art techniques down to an accessible, how-to level, the second edition of Applied Reliability will serve the practical needs of electronic, mechanical, and industrial engineers involved in the design and manufacture of components and systems, and of statisticians and scientists working on applied reliability problems. It will also be a highly suitable textbook for engineering courses in applied reliability and quality control. |
Inhoudsopgave
THE WEIBULL DISTRIBUTION81 | 81 |
Extreme Value Distribution Relationship89 | 89 |
Simulating Weibull Random Variables101 | 101 |
Applications of the Normal Distribution112 | 112 |
The Lognormal Life Distribution120 | 120 |
Lognormal Parameter Estimation127 | 127 |
RELIABILITY DATA PLOTTING135 | 135 |
Probability Plotting for the Exponential Distribution142 | 142 |
SYSTEM MODELS AND RELIABILITY ALGORITHMS219 | 219 |
APPLICATIONS | 251 |
Confidence Intervals for Low PPM264 | 264 |
Generating a Sampling Plan277 | 277 |
Minimum Sample Size Plans290 | 290 |
RENEWAL PROCESSES303 | 303 |
NONRENEWAL | 334 |
Testing for Trends and Randomness340 | 340 |
Probability Plotting for the Weibull Distribution151 | 151 |
Multicensored Data160 | 160 |
PHYSICAL ACCELERATION MODELS166 | 166 |
Nonhomogeneous Poisson Processes354 | 354 |
Simulation of Stochastic Processes367 | 367 |
Veelvoorkomende woorden en zinsdelen
90 percent confidence 95 percent acceleration factor acceleration model acceptance number analysis applies approximately assuming assumption average failure rate binomial distribution burn-in calculate censored Chapter chi-square chi-square distribution components confidence interval confidence level cumulative hazard derived described equation Example Exercise expected number exponential distribution fail failure mechanism failure mode failure rate Figure formula function given graph graphical histogram independent interarrival least squares linear logarithms lognormal distribution LTPD mean median method MTBF MTTF multicensored data natural logarithms normal distribution number of failures number of repairs observed obtained occur operating percent defective percent failures percentile Poisson distribution Poisson process population probability procedure random variable readout regression renewal process sample size sampling plan shape parameter sigma simulation slope Solution standard deviation standard normal statistical system age t₁ Table temperature tion Type units upper bound versus Weibull distribution zero
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