Advances in Imaging and Electron Physics: Aberration-corrected Electron MicroscopyAcademic Press, 12 jun 2009 - 590 pagina's The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth.
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Inhoudsopgave
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PART 3 Results obtained with aberrationcorrected instruments | 161 |
Contents of Volumes 151 and 152 | 525 |
Index | 527 |
Color Plate Section | 539 |
Overige edities - Alles bekijken
Advances in Imaging and Electron Physics: Aberration-corrected Electron ... Gedeeltelijke weergave - 2009 |
Veelvoorkomende woorden en zinsdelen
aberration coefficients aberration correction aberration function aberration-corrected alignment angle aperture astigmatism atomic columns atomic resolution atomic-resolution axial calculated carbon nanotube chromatic aberration coherence COLORPLATE crystal Cs-corrected CTEM defocus Dellby delocalization detector diffraction domain wall dumbbell EELS effect electron beam electron optics elements energy experimental fifth-order filter grain boundary HAADF images Haider hexapole corrector hexapole fields high-resolution HRTEM Hÿtch image contrast image intensity image plane improved information limit instrument interface Krivanek lattice Lentzen Lupini magnetic measured Microanal Microsc microscope mrad nanowire Nellist nonlinear objective lens obtained off-axial coma Optik oxygen parameters Pennycook perovskite phase shift Phys probe quadrupole Ronchigram Rose sample scanning transmission electron scattering Scherzer sextupole shown in Figure shows signal silicon simulations single atoms spatial frequencies specimen spherical aberration STEM imaging structure symmetry thickness third-order tion transmission electron microscopy Uhlemann Ultramicroscopy uncorrected voltage wave aberration Wien filter YBCO Z-contrast image