Advances in Imaging and Electron Physics: Aberration-corrected Electron MicroscopyAcademic Press, 12 jun 2009 - 590 pagina's The invention of the electron microscope more than 70 years ago made it possible to visualize a new world, far smaller than anything that could be seen with the traditional microscope. The biologist could study viruses and the components of cells, the materials scientist could study the structure of metals and alloys and many other substances, and especially their defects. But even the electron microscope had limits, and truly atomic structure was still too small to be observed directly. The so-called "limit of resolution" of the microscope was well understood, but attempts to use the necessary correctors were unsuccessful until the late 1990s. Such correctors now equip many microscopes in Europe, the USA and Japan and the results are extremely impressive. Moreover, microscopists feel that they are only at the beginning of a new era of subatomic microscopic imaging. In the present volume, we have brought together the principal contributors, instrument designers and microscopists to discuss this topic in depth.
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Pagina viii
... Corrected Transmission Electron Microscopy for Nanomaterials 385 Nobuo Tanaka I. Introduction 386 II. Imaging Theories of HRTEM Using Aberration Correctors 387 III. Actual Advantages for Observation by Cs-Corrected TEM 406 IV. Actual ...
... Corrected Transmission Electron Microscopy for Nanomaterials 385 Nobuo Tanaka I. Introduction 386 II. Imaging Theories of HRTEM Using Aberration Correctors 387 III. Actual Advantages for Observation by Cs-Corrected TEM 406 IV. Actual ...
Pagina 5
Aberration-corrected Electron Microscopy. to zero, he derived a nonlinear ... Cs of the spherical aberration of real electron lenses that cannot be ... Correction 5 II. Birth of Aberration Correction.
Aberration-corrected Electron Microscopy. to zero, he derived a nonlinear ... Cs of the spherical aberration of real electron lenses that cannot be ... Correction 5 II. Birth of Aberration Correction.
Pagina 46
... Cs-corrected TEM. With an aberration corrector the point resolution can be improved up to the information limit but never beyond. Because any multipole Cs corrector consists of focusing elements the corrector slightly increases the ...
... Cs-corrected TEM. With an aberration corrector the point resolution can be improved up to the information limit but never beyond. Because any multipole Cs corrector consists of focusing elements the corrector slightly increases the ...
Pagina 47
Aberration-corrected Electron Microscopy. Rose were ongoing to determine how to stimulate a correction project for ... Cs-corrected 300-kV CTEM for sub-angstrom resolution (Rose, 1990). Rose could convince Urban to move forward for such a ...
Aberration-corrected Electron Microscopy. Rose were ongoing to determine how to stimulate a correction project for ... Cs-corrected 300-kV CTEM for sub-angstrom resolution (Rose, 1990). Rose could convince Urban to move forward for such a ...
Pagina 52
... Cs corrector in a low-voltage SEM (Zach and Haider, 1995). This success—for ... corrected CM200F in February 1997 an information limit of ∼0.18 nm was ... Cs correction was no longer possible. The projector system could not be changed ...
... Cs corrector in a low-voltage SEM (Zach and Haider, 1995). This success—for ... corrected CM200F in February 1997 an information limit of ∼0.18 nm was ... Cs correction was no longer possible. The projector system could not be changed ...
Inhoudsopgave
41 | |
PART 3 Results obtained with aberrationcorrected instruments | 161 |
Contents of Volumes 151 and 152 | 525 |
Index | 527 |
Color Plate Section | 539 |
Overige edities - Alles bekijken
Advances in Imaging and Electron Physics: Aberration-corrected Electron ... Gedeeltelijke weergave - 2009 |
Veelvoorkomende woorden en zinsdelen
aberration coefficients aberration correction aberration function aberration-corrected alignment angle aperture astigmatism atomic columns atomic resolution atomic-resolution axial calculated carbon nanotube chromatic aberration coherence COLORPLATE crystal Cs-corrected CTEM defocus Dellby delocalization detector diffraction domain wall dumbbell EELS effect electron beam electron optics elements energy experimental fifth-order filter grain boundary HAADF images Haider hexapole corrector hexapole fields high-resolution HRTEM Hÿtch image contrast image intensity image plane improved information limit instrument interface Krivanek lattice Lentzen Lupini magnetic measured Microanal Microsc microscope mrad nanowire Nellist nonlinear objective lens obtained off-axial coma Optik oxygen parameters Pennycook perovskite phase shift Phys probe quadrupole Ronchigram Rose sample scanning transmission electron scattering Scherzer sextupole shown in Figure shows signal silicon simulations single atoms spatial frequencies specimen spherical aberration STEM imaging structure symmetry thickness third-order tion transmission electron microscopy Uhlemann Ultramicroscopy uncorrected voltage wave aberration Wien filter YBCO Z-contrast image